The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.
Measurements of adsorption strain in porous silicon by Raman scattering / M. A., Ferrara; L., Sirleto; Messina, Giacomo; M. G., Donato; I., Rendina; Santangelo, Saveria. - SPIE Vol. 6619:(2007), pp. 661913-661917. (Intervento presentato al convegno EWOFS 2007: Third European Workshop on Optical Fibre Sensors tenutosi a Napoli nel 4 July 2007 through 6 July 2007) [10.1117/12.738402].
Measurements of adsorption strain in porous silicon by Raman scattering
MESSINA, Giacomo;SANTANGELO, Saveria
2007-01-01
Abstract
The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
