The growing interest for the use of 4H-SiC in photonics is triggering the interest for more accurate characterizations of this semiconductor from the optical and opto-electronic point of view. In this work we report about new measurements run on an undoped 4H-SiC substrate, finalized at determining the precise dependence of its refractive index on temperature in the visible spectrum, and precisely at the wavelength of λ=632.8 nm, in a temperature range from room temperature (RT) to 400K. Measurements are performed by exploiting the properties of a Fabry-Perot cavity interrogated with a laser beam. It is known that the transmitted radiation intensity shows fringes that shift with temperature and the refractive index. By precisely monitoring the transmitted signal, the thermo-optic coefficient dn/dT can be determined with a resolution that approaches 10-6 K-1.

Accurate Determination of the Temperature Dependence of the Refractive Index of 4H-SiC at the Wavelength of 632 nm

Mallemace, Elisa Demetra
;
Rao, Sandro;Faggio, Giuliana;Messina, Giacomo;Della Corte, Francesco Giuseppe
2023-01-01

Abstract

The growing interest for the use of 4H-SiC in photonics is triggering the interest for more accurate characterizations of this semiconductor from the optical and opto-electronic point of view. In this work we report about new measurements run on an undoped 4H-SiC substrate, finalized at determining the precise dependence of its refractive index on temperature in the visible spectrum, and precisely at the wavelength of λ=632.8 nm, in a temperature range from room temperature (RT) to 400K. Measurements are performed by exploiting the properties of a Fabry-Perot cavity interrogated with a laser beam. It is known that the transmitted radiation intensity shows fringes that shift with temperature and the refractive index. By precisely monitoring the transmitted signal, the thermo-optic coefficient dn/dT can be determined with a resolution that approaches 10-6 K-1.
2023
978-3-0364-1320-4
thermo-optic coefficient, refractive index, temperature dependence
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12318/144668
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