In this paper we will present some applications drawn from a research project of national interest named MADEND (Methods and Applications of Non-destructive Electromagnetic Diagnostic). These applications concerns defect identification in metallic plate through Eddy Current Test, a survey on failure mechanisms in Au-Al junctions of integrated devices for automotive applications and analysis of civil building by means Electrical Resistive Tomography or Microwave Tomography.

New trends in ECT applications from the MADEND project / Versaci, Mario; Buonsanti, Michele; Coccorese, E.; Morabito, F. C.; Versaci, M.; Calcagno, Salvatore; Martone, R.; Formisano, A.; Cioffi, M.; Ferraioli, F.; Cardelli, E.; Faba, A.; Rubinacci, G.; Tamburrino, A.; Ventre, S.; Morozov, M.; Villone, F.; DI BARBA, P.; Savini, A.; Bettini, P.; Stella, A.; Specogna, R.; Trevisan, F.. - 1:(2004), pp. 715-718. (Intervento presentato al convegno PIERS 2004 tenutosi a Pisa nel 28-31 March 2004).

New trends in ECT applications from the MADEND project

VERSACI, Mario;BUONSANTI, Michele;F. C. MORABITO;CALCAGNO, SALVATORE;
2004-01-01

Abstract

In this paper we will present some applications drawn from a research project of national interest named MADEND (Methods and Applications of Non-destructive Electromagnetic Diagnostic). These applications concerns defect identification in metallic plate through Eddy Current Test, a survey on failure mechanisms in Au-Al junctions of integrated devices for automotive applications and analysis of civil building by means Electrical Resistive Tomography or Microwave Tomography.
2004
8884922682
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12318/17514
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