The knowledge of material physical properties is essential for a proper design of micro-electronic or micro-photonic devices. In this work, the thermo-optic effect, namely the refractive index dependence on temperature, was analized for 4H silicon carbide (4H-SiC) at the wavelength of interest for fiber-optic communication systems, A = 1.55 µm, by using a simple direct technique based on the multiple beam interference in a Fabry-Perot cavity. Measurements of refractive index and extinction coefficient were carried out in a wide wavelength range by spectroscopic ellipsometry.

Thermo-optic Effect of 4H-silicon Carbide at Fiber-optic Communication Wavelengths

Faggio, Giuliana;Messina, Giacomo;Rao, Sandro;Malara, Angela
2019-01-01

Abstract

The knowledge of material physical properties is essential for a proper design of micro-electronic or micro-photonic devices. In this work, the thermo-optic effect, namely the refractive index dependence on temperature, was analized for 4H silicon carbide (4H-SiC) at the wavelength of interest for fiber-optic communication systems, A = 1.55 µm, by using a simple direct technique based on the multiple beam interference in a Fabry-Perot cavity. Measurements of refractive index and extinction coefficient were carried out in a wide wavelength range by spectroscopic ellipsometry.
2019
978-1-7281-3403-1
Temperature measurement, Silicon carbide, Measurement by laser beam, Physics, Refractive index, Optical refraction, Optical variables control
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12318/57223
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