Efficient and reliable reconstruction of location and shape of dielectric targets via microwave imaging is relevant in many applications. In this respect, the linear sampling method is an effective candidate to pursue this task. However, despite its simplicity and computational effectiveness, still its use is restricted to the mathematical community wherein it has been originally developed. Starting from this observation, in this paper we propose and test a simple and original "physical" interpretation of the linear sampling methods, which shows its relationship with electromagnetic focusing problems. Taking advantage of this result we discuss merits and limitations of the method and suggest new guidelines for a successful application. The analysis is supported with results against experimental data.
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