In this Letter, detection/classification of defets are treated in a fuzzy way considering classes of defets to a certain depth characterized by typical ranges of comparison of similarities. So, depth evaluation is translated in terms of comparison of similarities among signals with defectiveness located at unknown depth and the class of signals without defects. In addition, an FPGA-based board implemeting the designed procedure will be discussed. The performance gives the comparability of the results with other established techniques.
|Titolo:||Fuzzy Approach and Eddy Current NDT/NDE Devices in Industrial Applications|
VERSACI, Mario (Corresponding)
|Data di pubblicazione:||2016|
|Appare nelle tipologie:||1.1 Articolo in rivista|