An analysis of electron scattering is presented, into short and long range components, and a comparison is made with the conventional decomposition into forward and back scattering. A generalized ν is defined in place of the usual backscattering coefficient. Results are shown, in terms of Monte Carlo simulation, relative to some cases of practical interest. In particular, a quite general system is discussed for master-mask fabrication. The limits of the conventional approach are demonstrated.
|Titolo:||The generalized backscattering coefficient: a novel parameter in electron scattering processes|
|Data di pubblicazione:||1992|
|Appare nelle tipologie:||1.1 Articolo in rivista|